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Recent Highlights
Recent Highlights
Nanoprobing on 3 nm technology transistors
Nanoprobing on 3 nm technology transistors
Nanoprobing: 3 nm technology EBIC
Nanoprobing: 3 nm technology EBIC
Nanoprobing: 3 nm technology EBAC
Nanoprobing: 3 nm technology EBAC
Nanoprobing: 5 nm, multiple EBAC traces
Nanoprobing: 5 nm, multiple EBAC traces
Weld-free mounting of lamellae for electrical biasing operando TEM
Weld-free mounting of lamellae for electrical biasing operando TEM
Operando two-terminal devices inside a transmission electron microscope
Operando two-terminal devices inside a transmission electron microscope
Stacking 2D Materials
Stacking 2D Materials
ACS Nano 2022, 16, 1836−1846
https://doi.org/10.1021/acsnano.1c09122
NATURE COMMUNICATIONS | (2020) 11:1743
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