Publications archive

Materials science

Materials science

Kobs, A., Spahr, H., Stickler, D., Hankemeier, S., Frömter, R. and Oepen, H.P., 2009. Magnetic energies of single submicron permalloy rectangles determined via magnetotransport.

Peng, Y., Cullis, T. and Inkson, B., 2008. Bottom-up Nanoconstruction by the Welding of Individual Nanoobjects Using Nanoscale Solder.

Shinonaga, T., Donohue, D., Ciurapinski, A. and Klose, D., 2008. Age determination of single plutonium particles after chemical separation.

Jiang, A.N., Gao, S., Wei, X.L., Liang, X.L. and Chen, Q., 2008. Amplitude Response of Multiwalled Carbon Nanotube Probe with Controlled Length during Tapping Mode Atomic Force Microscopy.

Stickler, D. Frömter, R., Li, W., Kobs, A. and Oepen, H.P., 2008. Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum.

Fernández-Pacheco, A., De Teresa, J.M., Córdoba, R. and Ibarra, M.R., 2008. Exploring the conduction in atomic-sized metallic constrictions created by controlled ion etching.

Cimalla, V., Röhlig, C., Pezoldt, J., Niebelschütz, M., Ambacher, O., Brückner, K., Hein, M., Weber, J., Milenkovic, S., Smith, A.J. and Hassel, A.W., 2008. Nanomechanics of Single Crystalline Tungsten Nanowires.

Wei, X.-L., Liu, Y., Chen, Q., Wang, M.-S. and Peng L.-M., 2007. The Very Low Shear Modulus of Multi-Walled Carbon Nanotubes Determined Simultaneously with the Axial Young’s Modulus via in situ Experiments.

Volkringer, C., Popov, D., Loiseau, T., Guillou, N., Ferey, G., Haouas, M., Taulelle, F., Mellot-Draznieks, C., Burghammer, M. and Riekel, C., 2007. A microdiffraction set-up for nanoporous metal–organic-framework-type solids.

Rösler, J,, Mukherji, D., Schock, K. and Kleindiek, S., 2007. Forging of metallic nano-objects for the fabrication of submicron-size components.

van Apeldoorn, A.A., Aksenov, Y., Stigter, M., Hofland, I., de Bruijn, J.D., Koerten, H.K., Otto, C., Greve, J. and van Blitterswijk, C.A., 2005. Parallel high-resolution confocal Raman SEM analysis of inorganic and organic bone matrix constituents.

Tay, A.B.H. and Thong, J.T.L., 2004. High-resolution nanowire atomic force microscope probe grown by a field-emission induced process.

Burkhardt, C., Bauerdick, S., Rudorf, R., Nisch, W., Bucher, V., Barth, W., Ehrmann, A., Lutz, T. and Rau, J., 2002. Investigation of low damage mask repair by combination of electron beam and scanning force technology.

Bauerdick, S., Barth, W., Bucher, V., Burkhardt, C., Rudorf, R. and Nisch, W., 2002. In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope.

Nanomanipulation

Nanomanipulation

Zheng, Q., Jiang, B., Liu, S., Weng, Y., Lu, L., Xue, Q., Zhu, J., Jiang, Q., Wang, S. and Peng, L., 2008. Self-Retracting Motion of Graphite Microflakes.

Wei, X.-L., Chen, Q., Liu, Y. and Peng, L.-M., 2007. Cutting and sharpening carbon nanotubes using a carbon nanotube ‘nanoknife’.

Hötzendorfer, H., Giouroudi, I., Bou, S. and Ferros, M., 2006. Evaluation of different control algorithms for a micromanipulation system.

Giouroudi, I., Hötzendorfer, H., Andrijasevic, D., Ferros, M. and Brenner, W., 2006. Design of a microgripping system with visual and force feedback for MEMS applications.

Nelson, B.J., Dong, L.X., Subramanian, A. and Bell, D.J., 2005. Hybrid nanorobotic approaches to NEMS.

Clévy, C., Hubert, A., Agnus, J. and Chaillet, N., 2005. A micromanipulation cell including a tool changer.

Chen, Q. and Peng, L.-M., 2004. Controlled cleavage of single semiconducting nanowires and study on the suitability of their use as nanocavities for nanolasers.

Tay, A.B.H. and Thong, J.T.L., 2004. Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique.

Kaegi, R. and Holzer, L., 2003. Transfer of a single particle for combined ESEM and TEM analyses.

Kaegi, R., Holzer, L. and Kleindiek, S., 2003. Separation of small particles using nanomanipulators in the ESEM.

Sinram, O., Ritter, M., Kleindiek, S., Schertel A., Hohenberg, H. and Albertz, J., 2002. Calibration of an SEM using a nano positioning tilting table and a microscopic calibration pyramid.