Kobs, A., Spahr, H., Stickler, D., Hankemeier, S., Frömter, R. and Oepen, H.P., 2009. Magnetic energies of single submicron permalloy rectangles determined via magnetotransport.
Peng, Y., Cullis, T. and Inkson, B., 2008. Bottom-up Nanoconstruction by the Welding of Individual Nanoobjects Using Nanoscale Solder.
Shinonaga, T., Donohue, D., Ciurapinski, A. and Klose, D., 2008. Age determination of single plutonium particles after chemical separation.
Jiang, A.N., Gao, S., Wei, X.L., Liang, X.L. and Chen, Q., 2008. Amplitude Response of Multiwalled Carbon Nanotube Probe with Controlled Length during Tapping Mode Atomic Force Microscopy.
Stickler, D. Frömter, R., Li, W., Kobs, A. and Oepen, H.P., 2008. Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum.
Fernández-Pacheco, A., De Teresa, J.M., Córdoba, R. and Ibarra, M.R., 2008. Exploring the conduction in atomic-sized metallic constrictions created by controlled ion etching.
Cimalla, V., Röhlig, C., Pezoldt, J., Niebelschütz, M., Ambacher, O., Brückner, K., Hein, M., Weber, J., Milenkovic, S., Smith, A.J. and Hassel, A.W., 2008. Nanomechanics of Single Crystalline Tungsten Nanowires.
Wei, X.-L., Liu, Y., Chen, Q., Wang, M.-S. and Peng L.-M., 2007. The Very Low Shear Modulus of Multi-Walled Carbon Nanotubes Determined Simultaneously with the Axial Young’s Modulus via in situ Experiments.
Volkringer, C., Popov, D., Loiseau, T., Guillou, N., Ferey, G., Haouas, M., Taulelle, F., Mellot-Draznieks, C., Burghammer, M. and Riekel, C., 2007. A microdiffraction set-up for nanoporous metal–organic-framework-type solids.
Rösler, J,, Mukherji, D., Schock, K. and Kleindiek, S., 2007. Forging of metallic nano-objects for the fabrication of submicron-size components.
van Apeldoorn, A.A., Aksenov, Y., Stigter, M., Hofland, I., de Bruijn, J.D., Koerten, H.K., Otto, C., Greve, J. and van Blitterswijk, C.A., 2005. Parallel high-resolution confocal Raman SEM analysis of inorganic and organic bone matrix constituents.
Tay, A.B.H. and Thong, J.T.L., 2004. High-resolution nanowire atomic force microscope probe grown by a field-emission induced process.
Burkhardt, C., Bauerdick, S., Rudorf, R., Nisch, W., Bucher, V., Barth, W., Ehrmann, A., Lutz, T. and Rau, J., 2002. Investigation of low damage mask repair by combination of electron beam and scanning force technology.
Bauerdick, S., Barth, W., Bucher, V., Burkhardt, C., Rudorf, R. and Nisch, W., 2002. In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope.